Slide 10 of 16
Notes:
The quality of the interface and oxide layer of the samples was measured using I-V measurements. All measurements were made in the dark at room temperature. Approximately 8 dots were measured on each type of sample. The system used to take the I-V data was a Keithley Instruments 617 programmable electrometer. The current was measured by stepping the gate voltage from 0 volts to 30 volts in 0.4 volt increments and waiting a dwell time of .4 seconds before measuring the current. This procedure was then repeated with gates voltages from 0 volts to -30 volts.
